Title :
An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability
Author :
Zheng, Feijun ; Cheng, Kwang-Ting ; Yan, Xiaolang ; Moondanos, John ; Hanna, Ziyad
Author_Institution :
Zhejiang Univ., Hangzhou
Abstract :
This paper presents a diagnostic test pattern generation (DTPG) framework based upon a Boolean Satisfiability engine. We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of undifferentiable faults. The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy. By exploring "don\´t cares " at the primary inputs, the number of required diagnostic patterns can be reduced. Experimental results show that the proposed method achieves a greater diagnosis resolution when combined with existing approaches. Also, fewer diagnostic test patterns are needed.
Keywords :
Boolean functions; automatic test pattern generation; computability; logic testing; Boolean satisfiability; diagnostic test pattern generation; fault candidates; stuck-at faults; Circuit faults; Circuit testing; Compaction; Engines; Failure analysis; Fault diagnosis; Multiplexing; Test pattern generators; USA Councils; Very large scale integration;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.80