Title :
Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic
Author :
Lei, Shaohua ; Han, Yinhe ; Li, Xiaowei
Author_Institution :
Chinese Acad. of Sci., Beijing
Abstract :
The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95% accuracy and several orders of magnitude faster with respect to HSTICE simulation.
Keywords :
CMOS logic circuits; VLSI; combinational circuits; logic testing; CMOS combinational circuit; VLSI technology; combinational logic; frequency analysis; transient errors; transient fault-due glitches; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Combinational circuits; Frequency estimation; Frequency response; Signal analysis; Transient analysis; Very large scale integration;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.35
