Title :
A single six-port reflectometer measures the scattering parameters of two-port microwave devices
Author :
de Oliveira, Antonio Jeronimo Belfort ; Neto, Sérgio Pedro Xavier
Author_Institution :
Dept. de Electron. e Sistemas, Univ. Federal de Pernambuco, Brazil
Abstract :
A single six-port reflectometer configuration is proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete the calibration procedure. Furthermore, s12 and s21 can be measured without reversing the device under test
Keywords :
S-parameters; calibration; measurement standards; microwave devices; microwave reflectometry; multiport networks; network analysis; calibration standard; network analyser; s12 measurement; s21 measurement; scattering parameter measurement; single six-port reflectometer; transmission coefficients; two-port microwave devices; Calibration; Circuits; Isolators; Measurement standards; Microwave devices; Microwave measurements; Microwave theory and techniques; Reflection; Scattering parameters; Switches;
Conference_Titel :
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2674-1
DOI :
10.1109/SBMOMO.1995.509698
