Title :
Current Testable Design of Resistor String DACs
Author :
Hashizume, Masaki ; Hata, Yutaka ; Nishida, Tomomi ; Yotsuyanagi, Hiroyuki ; Miura, Yukiya
Author_Institution :
Univ. of Tokushima, Tokushima
Abstract :
In this paper, a DFT method of resistor string digital-to-analog converters (DACs) is proposed so as to be tested fully by supply current testing. Targeted defects are opens and shorts in the DACs. Testability of a testable designed DAC is examined experimentally. The results show that shorts and opens in a testable designed DAC will be detected with a smaller number of test vectors by supply current testing.
Keywords :
design for testability; digital-analogue conversion; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; DFT method; design for testability; digital-to-analog converters; mixed signal IC; resistor string DAC; supply current testing; test vectors; CMOS logic circuits; Current measurement; Current supplies; Design for testability; Integrated circuit testing; Logic testing; Resistors; Switches; System testing; Voltage;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.94
