• DocumentCode
    2198725
  • Title

    Block Marking and Updating Coding in Test Data Compression for SoC

  • Author

    Zhang, Lei ; Liang, Huaguo ; Zhan, Wenfa ; Jiang, Cuiyun

  • Author_Institution
    Hefei Univ. of Technol., Hefei
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    467
  • Lastpage
    472
  • Abstract
    A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don ´t-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.
  • Keywords
    automatic testing; data compression; decoding; integrated circuit testing; system-on-chip; ISCAS-89 benchmark circuits; SoC; block marking; decompression structure; test data compression; updating coding; Benchmark testing; Circuit testing; Decoding; Educational institutions; Encoding; Hardware; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.57
  • Filename
    4388056