Title :
How the noise floor affects the production yield
Author_Institution :
Verigy Japan K.K., Tokyo
Abstract :
The noise floor is the noise distributed all of the frequency range and it does not include the spurious. At the test system, GNDs, power supplies and test modules have their own noise floor and the total sum of these noise floors affects the device test. The GND noise floor is hard to deal with because it is common mode noise and it is not easy to remove.
Keywords :
integrated circuit noise; test equipment; noise floor; power supplies noise; production yield; test modules noise; Bandwidth; Frequency; Noise figure; Noise measurement; Noise reduction; Performance evaluation; Power supplies; Production; Signal to noise ratio; System testing;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.116
