DocumentCode
2198803
Title
Production Test of High Volume Commercial RFIC
Author
Taenzler, Friedrich
Author_Institution
Texas Instrum., Dallas
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
476
Lastpage
476
Abstract
This presentation covers the motivations and constraints involved in multi-site testing of RF devices. A comprehensive list of these issues is documented in the following text.
Keywords
production testing; radiofrequency integrated circuits; RF devices; RFIC; multi-site testing; production test; radiofrequency integrated circuits; Automatic testing; Constraint optimization; Cost function; Design optimization; Instruments; Life testing; Production; Radio frequency; Radiofrequency integrated circuits; Wireless LAN;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.118
Filename
4388060
Link To Document