Title :
Top 5 Issues in Practical Testing of High-Speed Interface Devices
Author :
Yamaguchi, Takahiro J.
Author_Institution :
Advantest Lab. Ltd., Sendai
Abstract :
Recently very different ways have been proposed to perform jitter testing of high-speed physical layer ICs in an HV production testing environment.
Keywords :
integrated circuit noise; integrated circuit testing; jitter; production testing; high-speed interface devices; integrated circuit testing; jitter testing; production testing; resource partitioning; Circuit testing; Clocks; Frequency domain analysis; Frequency measurement; Laboratories; Production; Semiconductor device measurement; Test equipment; Time measurement; Timing jitter;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.122
