• DocumentCode
    2199006
  • Title

    Special Session: Analog Production Test

  • Author

    Muradali, Fidel ; Rivoir, Jochen

  • Author_Institution
    National Semiconductor
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    523
  • Lastpage
    523
  • Abstract
    In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.
  • Keywords
    Analog circuits; Circuit testing; Hardware; Manufacturing; Production; Research and development; Semiconductor device testing; Silicon; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing, China
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.56
  • Filename
    4388070