DocumentCode
2199006
Title
Special Session: Analog Production Test
Author
Muradali, Fidel ; Rivoir, Jochen
Author_Institution
National Semiconductor
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
523
Lastpage
523
Abstract
In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.
Keywords
Analog circuits; Circuit testing; Hardware; Manufacturing; Production; Research and development; Semiconductor device testing; Silicon; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing, China
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.56
Filename
4388070
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