DocumentCode :
2199006
Title :
Special Session: Analog Production Test
Author :
Muradali, Fidel ; Rivoir, Jochen
Author_Institution :
National Semiconductor
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
523
Lastpage :
523
Abstract :
In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.
Keywords :
Analog circuits; Circuit testing; Hardware; Manufacturing; Production; Research and development; Semiconductor device testing; Silicon; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing, China
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.56
Filename :
4388070
Link To Document :
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