DocumentCode
2199733
Title
EMC test specification for integrated circuits
Author
Klotz, Frank
Author_Institution
Automotive Power EMC Centre, Infineon Technologies AG, 81726 Munich, Germany
fYear
2007
fDate
24-28 Sept. 2007
Firstpage
73
Lastpage
78
Abstract
This paper presents a general EMC test specification for integrated circuits that is based on the internationally standardised test methods set out in IEC 61967 and IEC 62132 and specifies a generic procedure enabling a comparative characterisation of the EMC behaviour of different IC types. The specification contains general information about the test methods used, defines various IC function modules, pin types, and test and measurement networks, and provides a guide to selecting the pins to be tested, operating modes and limit values.
Keywords
Application specific integrated circuits; Automotive engineering; Circuit testing; Electromagnetic compatibility; Electronic equipment testing; IEC standards; Immunity testing; Integrated circuit testing; Radio frequency; TEM cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
Conference_Location
Munich, Germany
Print_ISBN
978-3-9523286-1-3
Electronic_ISBN
978-3-9523286-0-6
Type
conf
DOI
10.1109/EMCZUR.2007.4388199
Filename
4388199
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