DocumentCode
2199748
Title
Predicting the immunity of integrated circuits through measurement methods and simulation models
Author
Alaeldine, Ali ; Cordi, Jéroôme Cordi ; Perdriau, Richard ; Ramdani, Mohamed ; Levant, Jean-Luc
Author_Institution
ESEO - LATTIS - 4, rue Merlet de la Boulaye - BP 30926 - 49009 Angers - France
fYear
2007
fDate
24-28 Sept. 2007
Firstpage
79
Lastpage
82
Abstract
This paper introduces complete simulation models of typical electromagnetic immunity tests for integrated circuits (ICs). Direct Power Injection (DPI), Near-field (NF) and Very- Fast Transmission Line Pulsing (VF-TLP) experiments are modeled accurately, and comparisons between simulations and measurements for each set-up demonstrate the validity of this approach and lead to the development of an immunity prediction method for ICs.
Keywords
Circuit simulation; Circuit testing; Electromagnetic measurements; Electromagnetic modeling; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit testing; Noise measurement; Predictive models; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
Conference_Location
Munich, Germany
Print_ISBN
978-3-9523286-1-3
Electronic_ISBN
978-3-9523286-0-6
Type
conf
DOI
10.1109/EMCZUR.2007.4388200
Filename
4388200
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