DocumentCode
2200056
Title
SPICE data base for neutron (1 MeV) radiation hardening design: permanent damage effects simulation of bipolar transistors
Author
Rinaudo, O. ; Zimmer, T. ; Limtouch, S. ; Bourgoin, G. ; Lalande, P.
Author_Institution
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
fYear
1995
fDate
18-22 Sep 1995
Firstpage
161
Lastpage
164
Abstract
This paper presents a methodology which predicts quite easily neutron irradiated SPICE model parameters for BJT´s. This methodolgy is based on both the well-known neutron irradiation theory and the SPICE model. It has been demonstrated that the impact of neutron irradiation can be described through a modification of the unirradiated SPICE parameters without changing the intrinsic SPICE model
Keywords
SPICE; bipolar transistors; neutron effects; radiation hardening (electronics); semiconductor device models; 1 MeV; BJT; SPICE data base; bipolar transistors; intrinsic SPICE model; neutron irradiated SPICE model parameters; neutron irradiation theory; neutron radiation hardening design; permanent damage effects simulation; Bipolar transistors; Circuits; Degradation; Equations; Lattices; Neutrons; Predictive models; Radiation hardening; SPICE; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location
Arcachon
Print_ISBN
0-7803-3093-5
Type
conf
DOI
10.1109/RADECS.1995.509771
Filename
509771
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