Title :
Validation of a sea surface model for simulations of dynamic maritime SAR images
Author :
Yam, Luis E. ; Mallorqui, Jordi J. ; Rius, Joan M.
Author_Institution :
Dept. of Signal Theor. & Commun., Univ. Politec. de Catalunya (UPC), Barcelona, Spain
Abstract :
Controllable maritime scenarios have become a central issue in the research of new applications of SAR imaging to vessel monitoring systems. Numerical tools such as GRECOSAR, a SAR simulator of complex targets, are able to provide suitable test-beds as long as the model of the targets (vessels) and the sea surface resemble to what is expected in real maritime scenes. This paper presents the validation of SAR simulated images from GRECOSAR while using a dynamic and multi-harmonic elevation model of the sea surface. The simulations are carried out for generic C- and X-band SAR sensors. The results of the co-polar channels are compared with K, lognormal, Weibull and Rayleigh distributions, which are commonly used to describe statistics of real SAR images of the sea surface. The results show that the clutter has statistics closer to the K and Weibull distributions, suggesting that the elevation model presented can provide a more realistic approach in simulating SAR images of maritime scenarios.
Keywords :
Weibull distribution; geophysical image processing; log normal distribution; oceanographic techniques; radar imaging; remote sensing by radar; synthetic aperture radar; C-band SAR sensors; GRECOSAR; Rayleigh distribution; SAR simulator; Weibull distribution; X-band SAR sensors; copolar channels; dynamic elevation model; dynamic maritime SAR image simulations; lognormal distribution; maritime scenarios; multiharmonic elevation model; numerical tools; real SAR image statistics; real maritime scenes; sea surface model; sea surface resemble; vessel monitoring systems; Clutter; Marine vehicles; Sea surface; Sensors; Surface waves; Synthetic aperture radar; GRECOSAR; SAR; kdistribution; sea surface; simulation;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6350847