Title :
On Built-In Self-Test for multipliers
Author :
Pulukuri, Mary D. ; Starr, George J. ; Stroud, Charles E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
Abstract :
We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs).
Keywords :
built-in self test; field programmable gate arrays; frequency multipliers; voltage multipliers; built-in self-test; field programmable gate arrays; multiplexers; multipliers; single stuck-at gate-level fault coverage; Algorithm design and analysis; Analytical models; Built-in self-test; Circuit faults; Circuit testing; Digital signal processing; Field programmable gate arrays; Programmable logic arrays; Random access memory; Signal processing algorithms;
Conference_Titel :
IEEE SoutheastCon 2010 (SoutheastCon), Proceedings of the
Conference_Location :
Concord, NC
Print_ISBN :
978-1-4244-5854-7
DOI :
10.1109/SECON.2010.5453929
