DocumentCode :
2200145
Title :
Investigation on the convergence of the evanescent model and the polynomial model including Effective Conducting Path Effect (ECPE) for the submicronic SDG FD SOI MOSFET
Author :
Bouziane, A. ; Aouaj, A. ; Nouaçry, A.
Author_Institution :
Lab. de Phys. de la Mater. et Nanotechnol., Univ. Sultan Moulay Slimane, Beni-Mellal, Morocco
fYear :
2011
fDate :
May 30 2011-June 1 2011
Firstpage :
107
Lastpage :
110
Abstract :
We are presenting a convergence study of the evanescent model and the polynomial model with and without the Effective Conduction Path Effect (ECPE). These analytic models of the electric potential in the channel are used to analyze the short channel effect for the submicronic Symmetric DG FD SOI MOSFET. Hereby, we figure out the 2D Poisson equation and we analytically write, using the evanescent model, the surface potential, the threshold voltage, the DIBL and the sub-threshold swing. The natural scale length for the polynomial model λp and its corrected form λpc including the ECPE are mentioned. The results, of the analysis of the SCEs, show a good agreement of the evanescent model and the polynomial model including the ECPE with measures done by simulation tools.
Keywords :
MOSFET; Poisson equation; polynomials; silicon-on-insulator; 2D Poisson equation; channel electric potential; effective conducting path effect; evanescent model; natural scale length; polynomial model; short channel effect; submicronic SDG FD SOI MOSFET; subthreshold swing; threshold voltage; Convergence; Electric potential; Logic gates; MOSFET circuits; Mathematical model; Polynomials; Threshold voltage; DIBL; Effective Conduction Path Effect; Evanescent and polynomial models; Single Gate Fully Depleted SOI MOSFET; sub-threshold swing; surface potential; threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2011
Conference_Location :
Marrakech
Print_ISBN :
978-1-61284-646-0
Type :
conf
DOI :
10.1109/FTFC.2011.5948900
Filename :
5948900
Link To Document :
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