Title :
High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown
Author :
Vaisburd, David ; Tverdokhlebov, Sergey ; Tukhfatulin, Timmur
Author_Institution :
Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia
Abstract :
Since 1975, the authors´ laboratory has been investigating the critical electron emission from dielectrics into vacuum with nanosecond time resolution using high-current-density electron accelerators. It allowed them to clear up some intrinsic properties of the critical electron emission induced by electron beam injection: (1) the emission pulse is delayed for several nanoseconds from the injection pulse; (2) the peak value of the emission current reaches 100-1000 A; (3) direct experimental evidence is obtained for intense electron-hole generation by superhigh electric field in subsurface layer of dielectric-this process is discovered to be the main reason of the transition to critical electron emission; (4) critical emission is not uniform and accompanied by point explosions on the dielectric surface and by injections of ion plasmas from these points into vacuum; and (5) transition of critical emission to vacuum breakdown has been observed
Keywords :
current density; electric breakdown; electron emission; insulation testing; surface charging; surface discharges; vacuum breakdown; vacuum insulation; critical electron emission; dielectric breakdown; electron beam injection; emission current; emission pulse; high-current-density electron accelerators; injection pulse; insulation breakdown testing; intense electron-hole generation; ion plasma injection; laboratory; nanosecond time resolution; point explosions; subsurface layer; superhigh electric field; vacuum breakdown transition; DC generators; Delay; Dielectrics; Electron accelerators; Electron beams; Electron emission; Explosions; Plasma properties; Pulse generation; Vacuum breakdown;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-2906-6
DOI :
10.1109/DEIV.1996.545397