Title :
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Author :
Moran, A. ; LaBel, K. ; Gates, M. ; Seidleck, C. ; McGraw, R. ; Broida, M. ; Firer, J. ; Sprehn, S.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored
Keywords :
CMOS digital integrated circuits; computer testing; integrated circuit testing; microprocessor chips; space vehicle electronics; CMOS; Intel 80386 family; Intel 80486 microprocessor; coprocessor; latchup conditions; peripheral device; single event effect testing; spaceflight missions; Circuit testing; Clocks; Control systems; Coprocessors; Costs; Manufacturing processes; Microprocessors; NASA; Performance evaluation; Single event upset;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509788
