DocumentCode
2200518
Title
Radiation tests on BCD100 smart power technology
Author
Tastet, Pierre ; Garnier, Jerome ; Garraud, Laurent ; Chabannes, Patrice ; David, Jean Pierre ; Millan, Philippe
Author_Institution
CNES, Toulouse, France
fYear
1995
fDate
18-22 Sep 1995
Firstpage
284
Lastpage
288
Abstract
Since BCD100 Smart Power technology may be of interest for space applications, we have characterized the TSXKFC481A test vehicle under radiation (total dose and heavy ions)
Keywords
BiCMOS integrated circuits; gamma-ray effects; integrated circuit testing; ion beam effects; ion beams; power integrated circuits; space vehicle electronics; BCD100 smart power technology; BiCMOS; TSXKFC481A test vehicle; gamma rays; heavy ions; radiation tests; space applications; total dose; Bipolar transistors; Circuit testing; Light emitting diodes; Logic functions; Logic testing; Low voltage; MOSFETs; Protection; Space technology; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location
Arcachon
Print_ISBN
0-7803-3093-5
Type
conf
DOI
10.1109/RADECS.1995.509791
Filename
509791
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