Title :
TILMICRO, a new SEU and latch-up tester for microprocessors: initial results on 32-bit floating point DSPs
Author :
Bezerra, F. ; Hardy, Damien ; Velazco, R. ; Ziade, H.
Author_Institution :
CNES, Toulouse, France
Abstract :
As the need for 32 bit DSPs increases for on board equipment, we have built a new SEU and latch-up tester that is able to test processors such as these DSPs. The first results have been obtained on the 96002 from Motorola and the ADSP21020 from Analog Devices
Keywords :
aerospace computing; automatic test equipment; automatic testing; computer testing; digital signal processing chips; floating point arithmetic; integrated circuit testing; microprocessor chips; radiation effects; space vehicle electronics; special purpose computers; 32 bit; ADSP21020; ATE; Analog Devices; Motorola 96002; SEU tester; TILMICRO; floating point DSP chips; latchup tester; microprocessor testing; single event upset; space vehicle onboard systems; Data processing; Digital signal processing; Microprocessors; Power supplies; Silicon; Space vehicles; System testing; Threshold voltage; Turning; Vehicle dynamics;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509793
