SPICE simulation method for BCI component tests

This paper presents a virtual immunity test method using SPICE. This method facilitates EMC-compliant eletronic design. As an example, it is used to virtualize the BCI test method. It can also be applied to e.g. the stripline method. The required SPICE models of the components of the measurement setup are generated just once. They are based on scattering parameter measurements. These measurements are made with real RF components of the BCI test setup. In a schematic the SPICE models and the test circuit are connected according to the real test setup. At first in an AC analysis all voltages and currents are simulated by modelling the BCI clamp as an AC source with a constant stimulus of one volt. During real measurements a control computer sets the frequency-dependent amplitude of the generator. For this process, the standard DIN ISO 11452:4 specifies two test conditions: “open loop” and “closed loop”. In the virtual immunity test, all simulated voltages and currents due to the one volt stimulus are linearly scaled in order to match the real conditions using a computer-controlled frequency-dependent RF test power. This virtual test method makes the development process faster and cheaper.