DocumentCode
2200825
Title
SEU and latch-up results on transputers
Author
Bezerra, F. ; Velazco, R. ; Assoum, A. ; Benezech, D.
Author_Institution
CNES, Toulouse, France
fYear
1995
fDate
18-22 Sep 1995
Firstpage
340
Lastpage
345
Abstract
IMST805 and IMST225 transputers are being considered for space applications. In a view to predict their in orbit behaviour, their sensitivity to single event phenomena has been evaluated under heavy ion irradiation
Keywords
aerospace computing; computer testing; integrated circuit testing; ion beam effects; space vehicle electronics; special purpose computers; transputers; IMST225; IMST805; SEU sensitivity; heavy ion irradiation; in orbit behaviour prediction; latchup sensitivity; single event phenomena; single event upset; space applications; transputers; Cache memory; Circuit testing; Computer architecture; Microprocessors; Production; Read-write memory; Registers; Single event upset; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location
Arcachon
Print_ISBN
0-7803-3093-5
Type
conf
DOI
10.1109/RADECS.1995.509800
Filename
509800
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