Title :
Total dose responses of Actel 1020B and 1280A field programmable gate arrays (FPGAs)
Author :
Katz, Richard ; Swift, Gary ; Shaw, David
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Gamma irradiation and annealing of a large number of Actel FPGAs with in-situ current measurements were performed. Lot-to-lot, part-to-part, and burn in variations were measured. Findings include a catastrophic failure mechanism and minimal dose rate effects
Keywords :
annealing; field programmable gate arrays; gamma-ray effects; 1020B; 1280A; Actel FPGA; annealing; burn in; catastrophic failure; field programmable gate array; gamma irradiation; in-situ current measurement; lot-to-lot variations; part-to-part variations; total dose response; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Laboratories; Logic devices; Manufacturing; NASA; Programmable logic arrays; Propulsion; Space technology;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509812
