Title :
An experimental survey of heavy ion induced dielectric rupture in Actel field programmable gate arrays (FPGAs)
Author :
Swift, Gary ; Katz, Richard
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses
Keywords :
failure analysis; field programmable gate arrays; ion beam effects; Actel FPGA; LET; cross section; failure analysis; field programmable gate array; heavy ion irradiation; linear energy transfer; single event dielectric rupture; spacecraft; Circuit testing; Conductors; Dielectrics; Field programmable gate arrays; Frequency; Logic programming; Logic testing; MOSFETs; Space technology; Temperature;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509814
