An experimental survey of heavy ion induced dielectric rupture in Actel field programmable gate arrays (FPGAs)

Author

Swift, Gary ; Katz, Richard

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

1995

fDate

18-22 Sep 1995

Firstpage

425

Lastpage

430

Abstract

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses

Keywords

failure analysis; field programmable gate arrays; ion beam effects; Actel FPGA; LET; cross section; failure analysis; field programmable gate array; heavy ion irradiation; linear energy transfer; single event dielectric rupture; spacecraft; Circuit testing; Conductors; Dielectrics; Field programmable gate arrays; Frequency; Logic programming; Logic testing; MOSFETs; Space technology; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on

Conference_Location

Arcachon

Print_ISBN

0-7803-3093-5

Type

conf

DOI

10.1109/RADECS.1995.509814

Filename

509814

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2201139