Title :
Effects related to dose deposition profiles in integrated optics structures
Author :
West, R.H. ; Dowling, S.
Author_Institution :
R. Mil. Coll. of Sci., Shrivenham, UK
Abstract :
Results from exposures of lithium tantalate and lithium niobate integrated optic structures to pulses of high energy X-rays and fast electrons are related to dose and charge deposition profiles. Anomalous effects in the tantalate are ascribed to induced electric fields
Keywords :
X-ray effects; electron beam effects; integrated optics; lithium compounds; optical losses; LiNbO3; LiTaO3; charge deposition profiles; dose deposition profiles; fast electrons; high energy X-rays; induced electric fields; integrated optics structures; Electron optics; Integrated optics; Lithium niobate; Optical losses; Optical materials; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; X-rays;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509831
