DocumentCode :
2201584
Title :
A detailed study on high-voltage capacitor dielectric system under multistress conditions
Author :
Krishna Moorthy, P.A. ; Varughese, J.
Author_Institution :
Div. of Insulation, Electr. Res. & Dev. Assoc., Vadodara, India
Volume :
2
fYear :
1998
fDate :
7-10 Jun 1998
Firstpage :
456
Abstract :
This paper presents the results of a detailed study conducted using model capacitors and dielectric film to estimate the service life and the interaction behaviour of film and the impregnant. Model capacitors were prepared using films procured from different sources and subjected to accelerated ageing. The working life of HT capacitors at 25°C and 50 volts/micron stress is found to be above 30 years. The effect of temperature on the design of the model capacitor is discussed. A relatively new short-term technique of life estimation of film by continuous constant stress application has been studied. A new phenomenon of the formation of liquid-droplets on the film surface in this test was observed. The causes for this are discussed
Keywords :
ageing; dielectric thin films; life testing; power capacitors; 25 C; HT capacitor; accelerated multistress ageing; continuous constant stress; dielectric film; high voltage capacitor; impregnant; liquid droplet; service life; temperature effect; Accelerated aging; Capacitors; Conductive films; Dielectrics and electrical insulation; Life estimation; Life testing; Optical films; Petroleum; Polymer films; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1089-084X
Print_ISBN :
0-7803-4927-X
Type :
conf
DOI :
10.1109/ELINSL.1998.694832
Filename :
694832
Link To Document :
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