Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

Author

Seidleck, Christina M. ; LaBel, Kenneth A. ; Moran, Amy K. ; Gates, Michele M. ; Barth, Janet M. ; Stassinopoulos, E.G. ; Gruner, Timothy D.

Author_Institution

Hughes ST Syst., Lanham, MD, USA

fYear

1995

fDate

18-22 Sep 1995

Firstpage

581

Lastpage

588

Abstract

We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed

Keywords

space vehicle electronics; electrical design; flight data analysis; multiple NASA spacecraft; single event effect; Aerospace electronics; CMOS technology; Data analysis; Integrated circuit technology; Microprocessors; NASA; Optical fibers; Random access memory; Space technology; Space vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on

Conference_Location

Arcachon

Print_ISBN

0-7803-3093-5

Type

conf

DOI

10.1109/RADECS.1995.509840

Filename

509840

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2201722