DocumentCode :
2201745
Title :
A high frequency microdischarge detection technique for electrical insulation and capacitors
Author :
Stopher, J.P. ; Zirnheld, J.L. ; Burke, K.M. ; Dollinger, R.E. ; Sarjeant, W.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
Volume :
2
fYear :
1998
fDate :
7-10 Jun 1998
Firstpage :
476
Abstract :
Today´s modern electrical devices are increasingly subject to, and must withstand, high frequency stressing. Such stressing contributes to accelerated aging of electrical insulation and has resulted in premature failure of components. In order to understand the aging mechanisms (i.e., microdischarge induced erosion, thermal runaway, etc.) and make valid conclusions regarding the service lifetime of components used under high frequency conditions, the electrical insulation must be examined under those same high frequency conditions as those in which it will be used. Conventional electrical techniques used to detect partial discharges are limited to below 2 kHz applied ac test voltages. A new technique was developed, in order to stress electrical insulation and examine the microdischarge activity for frequencies up to 100 kHz. This technique uses series resonance to achieve a high frequency sinusoidal steady state ac test voltage and a bridge type test cell to detect the resulting microdischarge activity. Experimental discharge traces are consistent with simulations, showing improved source voltage attenuation compared to conventional techniques. In addition, the calibration technique shows a critically damped single pulse per discharge event with a temporal resolution of <0.5 μsec. Experimental results are presented
Keywords :
ageing; capacitors; high-frequency discharges; insulation testing; life testing; 0 to 100 kHz; accelerated aging; aging mechanisms; bridge type test cell; calibration technique; capacitors; electrical insulation; high frequency microdischarge detection technique; high frequency stressing; premature failure; series resonance; service lifetime; source voltage attenuation; temporal resolution; thermal runaway; Accelerated aging; Dielectrics and electrical insulation; Fault location; Frequency; Partial discharges; Resonance; Steady-state; Stress; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1089-084X
Print_ISBN :
0-7803-4927-X
Type :
conf
DOI :
10.1109/ELINSL.1998.694837
Filename :
694837
Link To Document :
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