DocumentCode :
2201786
Title :
Characterizations of locally testable events
Author :
Brzozowski, J.A. ; Simon, Imre
fYear :
1971
fDate :
13-15 Oct. 1971
Firstpage :
166
Lastpage :
176
Abstract :
Let Σ be a finite alphabet, Σ* the free monoid generated by Σ and |x| the length of x ε Σ*. For any integer k ≥ 0, fk(x)(tk (x)) is x if |x| ≪ k+1, and it is the prefix (suffix) of x of length k, otherwise. Also let mk+1 (x) = {v|x = uvw and |v| = k+1}. For x,y ε Σ* define x ∼k+1y iff fk(x) = fk(y), tk(x) = tk(y) and mk+1(x) = mk+1 (y). The relation ∼k+1 is a congruence of finite index over Σ*. An event E ⊆ Σ*. is (k+1)-testable iff it is a union of congruence classes of ∼k+1. E is locally testable (LT) if it is k+1-testable for some k. (This definition differs from that of [MP] but is equivalent.) We show that the family of LT events is a proper sub-family of star-free events of dot-depth 1. LT events and k-testable events are characterized in terms of (a) restricted star-free expressions based on finite and cofinite events, (b) finite automata accepting these events, (c) semigroups, and (d) structural decomposition of such automata. Algorithms are given for deciding whether a regular event is (a) LT and (b) k+1-testable. Generalized definite events are also characterized.
Keywords :
Automata; Character generation; Computer science; Instruction sets; Testing; Vents;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Switching and Automata Theory, 1971., 12th Annual Symposium on
Conference_Location :
East Lansing, MI, USA
ISSN :
0272-4847
Type :
conf
DOI :
10.1109/SWAT.1971.6
Filename :
4569677
Link To Document :
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