• DocumentCode
    2202207
  • Title

    Evaluation of high-voltage impulse waveforms using model-based deconvolution

  • Author

    FitzPatrick, G.J. ; Simmon, E.D. ; Lagnese, J.E.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    7-10 Jun 1998
  • Firstpage
    490
  • Abstract
    Accurate measurement of high voltage (HV) impulse waveforms is of critical importance in the testing of HV apparatus and for fundamental insulation studies. Quantifying the measurement system errors can be performed by following procedures recommended by the international standards for high voltage testing. Application of deconvolution techniques to reduce measurement errors by calculating the input waveform using the measured step response have been explored, but they are particularly sensitive to noise in digitized data; small random errors in the measured waveforms can result in large oscillations in the deconvolved waveforms. This paper presents a technique for effectively performing a deconvolution of measured high voltage impulse waveforms using the step response of the measurement system and input waveform model based upon the impedance parameters of the test circuit. Data are presented that demonstrate a significant advantage of this approach in estimating the deconvolved input and its insensitivity to random noise in the measured data. Results for different analytic models for the input waveforms are also included
  • Keywords
    deconvolution; impulse testing; insulation testing; measurement standards; step response; HV apparatus; analytic models; deconvolved input; deconvolved waveforms; fundamental insulation studies; high voltage testing; high-voltage impulse waveforms; impedance parameters; input waveform; input waveform model; international standards; measured step response; measurement system errors; model-based deconvolution; random errors; step response; Circuit testing; Deconvolution; Impedance measurement; Impulse testing; Insulation testing; Noise measurement; Particle measurements; Performance evaluation; System testing; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-4927-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1998.694840
  • Filename
    694840