DocumentCode
2202207
Title
Evaluation of high-voltage impulse waveforms using model-based deconvolution
Author
FitzPatrick, G.J. ; Simmon, E.D. ; Lagnese, J.E.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
2
fYear
1998
fDate
7-10 Jun 1998
Firstpage
490
Abstract
Accurate measurement of high voltage (HV) impulse waveforms is of critical importance in the testing of HV apparatus and for fundamental insulation studies. Quantifying the measurement system errors can be performed by following procedures recommended by the international standards for high voltage testing. Application of deconvolution techniques to reduce measurement errors by calculating the input waveform using the measured step response have been explored, but they are particularly sensitive to noise in digitized data; small random errors in the measured waveforms can result in large oscillations in the deconvolved waveforms. This paper presents a technique for effectively performing a deconvolution of measured high voltage impulse waveforms using the step response of the measurement system and input waveform model based upon the impedance parameters of the test circuit. Data are presented that demonstrate a significant advantage of this approach in estimating the deconvolved input and its insensitivity to random noise in the measured data. Results for different analytic models for the input waveforms are also included
Keywords
deconvolution; impulse testing; insulation testing; measurement standards; step response; HV apparatus; analytic models; deconvolved input; deconvolved waveforms; fundamental insulation studies; high voltage testing; high-voltage impulse waveforms; impedance parameters; input waveform; input waveform model; international standards; measured step response; measurement system errors; model-based deconvolution; random errors; step response; Circuit testing; Deconvolution; Impedance measurement; Impulse testing; Insulation testing; Noise measurement; Particle measurements; Performance evaluation; System testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location
Arlington, VA
ISSN
1089-084X
Print_ISBN
0-7803-4927-X
Type
conf
DOI
10.1109/ELINSL.1998.694840
Filename
694840
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