Title :
RF thermal plasma CVD of diamond: the role of acetylene in film morphology
Author :
Larson, J.L. ; Iordanoglou, D.I. ; Girshick, Steven L.
Author_Institution :
Dept. of Mech. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
Summary form only given. Diamond films produced by chemical vapor deposition (CVD) show faceting which is characterized by {100} or {111} surfaces. Many investigators have found that the morphology is systematically affected by substrate temperature, but contrary trends have been reported in the literature. In particular, some thermal plasma and combustion flame results have indicated that higher substrate temperatures shift the faceting from {111} to {100}, while most other results have indicated just the opposite. In this work we report that these contrary trends can be explained by the relative abundance of acetylene at the diamond surface during film growth. Diamond film growth experiments were conducted using an RF (3.2 MHz) plasma torch operating in the pressure range 267-1013 mbar (200-760 Torr). The plasma consists of argon and hydrogen with injected methane. Gas was sampled through a micro-orifice in the center of the film growth substrate and delivered to a gas chromatograph (GC), which provides measurements of several stable chemical species. A detailed two-dimensional numerical model was developed of the flow and chemistry in the region between the torch exit and the substrate, including the effect of the sampling orifice, and chemistry in the gas sampling line was modeled assuming plug flow.
Keywords :
diamond; organic compounds; plasma CVD; plasma CVD coatings; plasma torches; surface topography; 200 to 760 torr; 267 to 1013 mbar; 3.2 MHz; RF plasma torch; RF thermal plasma CVD; acetylene; chemical vapour deposition; combustion flame; diamond film growth; diamond films; faceting; film growth; film morphology; gas chromatograph; gas sampling line; micro-orifice; plug flow; relative abundance; sampling orifice; substrate temperature; substrate temperatures; thermal plasma; torch exit; two-dimensional numerical model; {100} surfaces; {111} surfaces; Chemical vapor deposition; Combustion; Plasma chemistry; Plasma measurements; Plasma stability; Plasma temperature; Radio frequency; Sampling methods; Substrates; Surface morphology;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854736