Title :
An architecture for self-healing digital systems
Author :
Lala, P.K. ; Kumar, B. Kiran
Author_Institution :
Dept. of Comput. Sci. & Comput. Eng., Arkansas Univ., Fayetteville, AR, USA
Abstract :
The use of very deep submicron technology makes VLSI-based digital systems more susceptible to transient or soft errors, and thus compromises their reliability. This paper proposes an architecture inspired by the human immune system that allows tolerance of such errors.
Keywords :
VLSI; circuit complexity; digital systems; error detection; fault diagnosis; fault tolerant computing; finite state machines; state assignment; VLSI-based digital systems; antigen detection; error detection; error tolerance; finite state machine; functional cells; genetic codes; human immune system inspired architecture; reliability; self-healing digital systems; soft errors; spare cells; state assignment; transient errors; very deep submicron technology; Centralized control; Computer architecture; Computer errors; Computer science; Control systems; Digital systems; Fault detection; Humans; Immune system; Reliability engineering;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030175
