Title :
Coding scheme for low energy consumption fault-tolerant bus
Author :
Rossi, D. ; van Dijk, V.E.S. ; Kleihorst, R.P. ; Nieuwland, A.H. ; Metra, C.
Author_Institution :
Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
We address the problem of devising the error correcting code which, if used to encode the information on a very deep submicron (VDSM) bus, allows us to achieve fault-tolerance with the minimal impact on bus power consumption and power-delay product. In particular, we first report the results of an analysis that we performed on power dissipation in VDSM fault-tolerant busses using Hamming single error correcting codes. We show that no power saving is possible by choosing between different optimal Hamming codes with the same redundancy. We then propose a new coding scheme which provides a reduction of the energy consumption and power-delay product of over the 11.5% and 45%, respectively, with respect to the optimal (7,4) Hamming code, for a 0.13μm CMOS technology bus.
Keywords :
Hamming codes; error correction codes; fault tolerant computing; low-power electronics; system buses; CMOS technology bus; bus electrical model; capacitance model; error correcting code; fault-tolerant bus; low energy consumption; optimal Hamming code; optimal coding scheme; power-delay product; very deep submicron bus; CMOS technology; Capacitance; Crosstalk; Energy consumption; Error correction codes; Fault detection; Fault tolerance; Power dissipation; Testing; Wires;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030176