Title :
Fault tolerance evaluation using two software based fault injection methods
Author :
Ademaj, Astrit ; Grillinger, Petr ; Herout, Pavel ; Hlavicka, Jan
Author_Institution :
Real-Time Syst. Group, Vienna Univ. of Technol., Austria
Abstract :
A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. The main objective of this work is to verify whether the simulation model of the TTP/C protocol behaves in the presence of faults in the same way as the existing hardware prototype implementation. Thus, the experimental results of the software implemented fault injection applied in the simulation model and in the hardware implementation of the TTP/C network have been compared. Fault injection experiments in both the hardware and the simulation model are performed using the same configuration setup, and the same fault injection input parameters (fault injection location, fault type and the fault injection time). The end result comparison has shown a complete conformance of 96.30%, while the cause of the different results was due to hardware specific implementation of the built-in-self-test error detection mechanisms.
Keywords :
built-in self test; error detection; fault simulation; hardware-software codesign; software fault tolerance; transport protocols; C-Sim simulation; C-code model; TTP/C protocol; built-in-self-test error detection; fault injection location; fault injection time; fault tolerance evaluation; fault type; hardware prototype implementation; silicon independent C-Based model; sine-wave application; software based fault injection methods; time triggered architecture; Application software; Communication system control; Computational modeling; Computer architecture; Computer science; Fault tolerance; Hardware; Protocols; Software prototyping; Virtual prototyping;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030178