DocumentCode
2202498
Title
Fault tolerance evaluation using two software based fault injection methods
Author
Ademaj, Astrit ; Grillinger, Petr ; Herout, Pavel ; Hlavicka, Jan
Author_Institution
Real-Time Syst. Group, Vienna Univ. of Technol., Austria
fYear
2002
fDate
2002
Firstpage
21
Lastpage
25
Abstract
A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. The main objective of this work is to verify whether the simulation model of the TTP/C protocol behaves in the presence of faults in the same way as the existing hardware prototype implementation. Thus, the experimental results of the software implemented fault injection applied in the simulation model and in the hardware implementation of the TTP/C network have been compared. Fault injection experiments in both the hardware and the simulation model are performed using the same configuration setup, and the same fault injection input parameters (fault injection location, fault type and the fault injection time). The end result comparison has shown a complete conformance of 96.30%, while the cause of the different results was due to hardware specific implementation of the built-in-self-test error detection mechanisms.
Keywords
built-in self test; error detection; fault simulation; hardware-software codesign; software fault tolerance; transport protocols; C-Sim simulation; C-code model; TTP/C protocol; built-in-self-test error detection; fault injection location; fault injection time; fault tolerance evaluation; fault type; hardware prototype implementation; silicon independent C-Based model; sine-wave application; software based fault injection methods; time triggered architecture; Application software; Communication system control; Computational modeling; Computer architecture; Computer science; Fault tolerance; Hardware; Protocols; Software prototyping; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN
0-7695-1641-6
Type
conf
DOI
10.1109/OLT.2002.1030178
Filename
1030178
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