DocumentCode :
2202522
Title :
Automated synthesis of SEU tolerant architectures from OO descriptions
Author :
Chiusano, S. ; Carlo, S. Di ; Prinetto, P.
Author_Institution :
Dipartimento di Automatica e Inf., Politecnico di Torino, Italy
fYear :
2002
fDate :
2002
Firstpage :
26
Lastpage :
31
Abstract :
SEU faults are a well-known problem in aerospace environment but recently their relevance grew up also at ground level in commodity applications coupled, in this frame, with strong economic constraints in terms of costs reduction. On the other hand, latest hardware description languages and synthesis tools allow reducing the boundary between software and hardware domains making the high-level descriptions of hardware components very similar to software programs. Moving from these considerations, the present paper analyses the possibility of reusing Software Implemented Hardware Fault Tolerance (SIHFT) techniques, typically exploited in micro-processor based systems, to design SEU tolerant architectures. The main characteristics of SIHFT techniques have been examined as well as how they have to be modified to be compatible with the synthesis flow. A complete environment is provided to automate the design instrumentation using the proposed techniques, and to perform fault injection experiments both at behavioural and gate level. Preliminary results presented in this paper show the effectiveness of the approach in terms of reliability improvement and reduced design effort.
Keywords :
VLSI; hardware description languages; hardware-software codesign; integrated circuit reliability; integrated circuit testing; object-oriented programming; radiation hardening (electronics); software fault tolerance; space vehicle electronics; OO descriptions; SEU tolerant architectures; SystemC environment; aerospace environment; automated synthesis; behavioural level; fault injection; gate level; microprocessor based systems; reduced design effort; reliability improvement; software implemented hardware fault tolerance; Circuit synthesis; Condition monitoring; Costs; Environmental economics; Fault tolerant systems; Hardware design languages; Single event upset; Software tools; Space technology; Space vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
Type :
conf
DOI :
10.1109/OLT.2002.1030179
Filename :
1030179
Link To Document :
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