Title :
A new self-checking code-disjoint carry-skip adder
Author :
Marienfeld, D. ; Sogomonyan, E.S. ; Ocheretnij, V. ; Gössel, M.
Author_Institution :
Dept. of Comput. Sci., Univ. of Potsdam, Germany
Abstract :
In this paper the first self-checking code-disjoint carry-skip adder is investigated The adder is code-disjoint with respect to the parity encoded operands and self-testing and fault-secure with respect to all single stuck-at faults of the adder cells.
Keywords :
adders; built-in self test; carry logic; fault diagnosis; logic CAD; logic testing; CAD modelling; code-disjoint carry-skip adder; fault-secure; fixed block size; high speed adders; parity encoded operands; ripple-carry adder cells; self testing; self-checking adder; single stuck-at faults; Added delay; Built-in self-test; Clocks; Computer science; Conferences; Delay effects; Fault detection; Fault tolerance; Power dissipation; Testing;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030181
