• DocumentCode
    2202572
  • Title

    Sequential circuits applicable for detecting different types of faults

  • Author

    Levin, I. ; Sinelnikov, V. ; Karpovsky, M. ; Ostanin, S.

  • Author_Institution
    Tel Aviv Univ., Ramat Aviv, Israel
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    This paper presents methods for designing totally self-checking Mealy type synchronous sequential circuits (SSCs). We use implementations of the output and next state functions that are monotonic in state variables. The monotony enables the SSC to react to permanent faults differently than it does to transient faults. If the fault is permanent, the SSC will produce a non-code output, which will be detected as error by the checker after a number of clock cycles. In the case of a transient fault, the SSC is able to survive and to return to normal operation after a number of clock cycles. A novel universal architecture of self-checking SSCs enabling to overcome the above contradiction is proposed. This architecture can be adopted both for reduction of the fault latency of a permanent fault and for increasing the SSC survivability with respect to a transient fault. A method for SSC synthesis for the proposed architecture is presented. This method is oriented to FPGA implementation.
  • Keywords
    built-in self test; fault simulation; fault tolerant computing; field programmable gate arrays; logic CAD; logic testing; sequential circuits; state assignment; FPGA implementation; Mealy type circuits; configurable logic blocks; design methods; fault latency; fault model; monotony; next state functions; permanent faults; self-healing; state variables; synchronous sequential circuits; totally self checking circuits; transient faults; universal architecture; universal match-detector; Circuit faults; Conferences; Electrical fault detection; Fault detection; Sequential circuits; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030182
  • Filename
    1030182