Title :
A statistical sampler for a new on-line analog test method
Author :
Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro A.
Author_Institution :
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
In this work a new strategy to the on-line test of analog circuits is presented. The technique presents a very low analog overhead and it is completely digital. For the System-on-Chip (SoC) environment, this allows the implementation of on-line test using processing power already present in the system. As all the signal processing is done in the digital domain, it allows use of a purely digital tester or a digital BIST technique. The main principle of operation is based on the observation of statistical properties of the circuit under test. Due to the low analog power and performance overhead, the proposed technique can be used to analyze the output of several stages of complex analog systems without the use of switches or analog multiplexors, as no additional AD converter is needed. This paper presents the fundamentals of the proposed test method and some preliminary results concerning linear analog systems.
Keywords :
analogue integrated circuits; built-in self test; integrated circuit testing; signal sampling; spectral analysis; transfer functions; white noise; FFT; analog circuits; complex analog systems; digital BIST; on-line test strategy; power spectrum density; statistical sampler; system-on-chip environment; transfer function; very low analog overhead; voltage comparator; white noise generator; Analog circuits; Built-in self-test; Circuit testing; Digital signal processing; Filters; Performance analysis; Spectral analysis; System testing; System-on-a-chip; Transfer functions;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030188
