Title :
Free electron energy during the aging of an organic dielectric under switching impulse voltages
Author :
Karagiannopoulos, C.G. ; Bourkas, P.D. ; Agoris, D.P. ; Psomopoulos, C.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
Abstract :
In this work, an experimental approach to the electronic phenomena during the ageing of a metal-dielectric-metal model is performed, under the application of high impulse voltages of the form 250/2500 μs. The outbreak of partial discharges in the above system may come as the result of impact ionization effect, and plays a very important role in the dielectric ageing procedure. The experimental results show an exponential increase of the free electron energy with the applied electric field, as a direct implication of the electron avalanche mechanism. The above energy involved with the partial discharges depends on the environmental temperature (partial discharges enhanced by temperature)
Keywords :
ageing; avalanche breakdown; dielectric measurement; impact ionisation; impulse testing; partial discharge measurement; 250 mus; 2500 mus; aging; applied electric field; electron avalanche mechanism; environmental temperature; free electron energy; impact ionization effect; metal-dielectric-metal model; organic dielectric; partial discharges; switching impulse voltages; Aging; Assembly; Dielectric measurements; Dielectrics and electrical insulation; Electrodes; Electrons; Oil insulation; Partial discharges; Petroleum; Voltage;
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-4927-X
DOI :
10.1109/ELINSL.1998.694842