Title :
Analog Switches in programmable analog devices: quiescent defective behaviour
Author :
Rodríguez-Montañés, R. ; Muñoz, D. ; Balado, L. ; Figueras, J.
Author_Institution :
Departament d´´Enginyeria Electronica, Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
Analog switches (AS) have played an essential role in a large number of mixed signal (M-S) circuits. Depending on the use of the AS, designers have optimised their topology to the needs of each specific switching function. The success of field programmable devices in the digital domain has motivated some manufacturers to explore similar solutions to fast prototyping in the analog and M-S domains. In this work we explore the defective behaviours of programmable AS under realistic catastrophic and parametric defects. A classification of the defective behaviours for bridge and open defects is done. It shows that the. simple fault model, with faulty state of permanently transistor stuck-on or stuck-off, is not sufficient to reflect the real behaviour of the switch.
Keywords :
CMOS analogue integrated circuits; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; programmable circuits; sample and hold circuits; switching circuits; analog switches; bridge defects; catastrophic defects; fast prototyping; field programmability; mixed signal circuits; open defects; parametric defects; permanently transistor stuck-off; permanently transistor stuck-on; programmable analog devices; quiescent defective behaviour; response satisfying specifications; response violating specifications; simple fault model; threshold voltage variations; Circuit faults; Circuit testing; Circuit topology; Design optimization; Digital control; Field programmable analog arrays; Manufacturing; Prototypes; Switches; Switching circuits;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030191
