• DocumentCode
    2202836
  • Title

    Bit flip injection in processor-based architectures: a case study

  • Author

    Cardarilli, G.C. ; Kaddour, F. ; Leandri, A. ; Ottavi, M. ; Pontarelli, S. ; Velazco, R.

  • Author_Institution
    Dept. of Electron. Eng., Tor Vergata Univ., Rome, Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    117
  • Lastpage
    127
  • Abstract
    This paper presents the principles of two different approaches for the study of the effect of transient bit flips on the behavior of processor-based digital architectures: one of them based on the on-line "injection" and execution of pieces of code (called CEU codes) using a suitable hardware architecture, while the other is performed using a behavioral level processor description; being based on the so-called "saboteurs" method. Results obtained for benchmark programs executed by a widely used commercial 8-bit microprocessor, allow to validate both approaches which provide inputs for an original error rate prediction methodology. The comparison of predictions to measured error rates issued from radiation ground testing validates the proposed error rate prediction approach.
  • Keywords
    fault simulation; fault tolerant computing; hardware description languages; matrix multiplication; microcontrollers; radiation hardening (electronics); 80C51 microcontroller; CEU codes; behavioral level processor description; bit flip injection; concurrency; digital architectures; error rate prediction; fault injection; matrix multiplication program; on-line execution; on-line injection; pieces of code; pipeline blocks; processor-based architectures; radiation ground testing; saboteurs method; single event upset; transient bit flips; vector-sorting program; Circuit faults; Computer aided software engineering; Electromagnetic radiation; Error analysis; Hardware; Integrated circuit modeling; Microprocessors; Performance evaluation; Single event upset; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030194
  • Filename
    1030194