Title :
Parallel implementation of the Hough transform for the extraction of rectangular objects
Author :
Hopwood, LeAndra ; Miller, Winston ; George, Alan
Author_Institution :
High Performance Comput. & Simulation Res. Lab., Florida State Univ., Tallahassee, FL, USA
Abstract :
In image processing applications, the storage capacity required for images can exceed feasible storage capabilities. A technique to alleviate this problem by removal of unnecessary background information through image processing is discussed. Specifically, a parallel implementation of a first-order, derivative-based edge detection algorithm and the Hough transform applied to rectangular objects is given. A variation of the classical Hough transform to detect lines is employed to locate rectangular objects of known size in an image. A parallel virtual machine is used to exploit the inherent parallelism found in these algorithms over a cluster of 7 workstations. Through the use of these techniques, the rectangular object is detected and stored as a separate image, and storage capacity can be reduced by approximately 30%, not including standard data compression. Parallelizing the algorithms provides a significant speedup advantage over the normal sequential operation of the programs
Keywords :
Hough transforms; digital storage; edge detection; parallel algorithms; parallel machines; virtual machines; workstations; Hough transform; background information removal; data compression; derivative based edge detection algorithm; first-order algorithm; image line detection; image processing applications; parallel algorithms; parallel implementation; parallel language; parallel virtual machine; rectangular object detection; rectangular objects extraction; storage capacity; workstations; Clustering algorithms; Computational modeling; Digital images; Image edge detection; Image segmentation; Image storage; Laboratories; Object detection; Packaging machines; Virtual machining;
Conference_Titel :
Southeastcon '96. Bringing Together Education, Science and Technology., Proceedings of the IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
0-7803-3088-9
DOI :
10.1109/SECON.1996.510069