Title :
BIST-based delay-fault testing in FPGAs
Author :
Abramovici, Miron ; Stroud, Charles
Author_Institution :
Circuits & Syst. Res. Lab., Agere Syst., Murray Hill, NJ, USA
Abstract :
We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, and does not require expensive ATE. We have successfully implemented this BIST approach on the ORCA 2C series FPGA.
Keywords :
built-in self test; fault diagnosis; fault tolerant computing; field programmable gate arrays; integrated circuit testing; logic testing; BIST technique; FPGA; ORCA 2C series; VLSI; configurable interconnect points; delay-fault testing; fault tolerance; off-line testing; on-line testing; parallel STAR; roving STAR; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Clocks; Delay; Field programmable gate arrays; Frequency; Logic testing; Manufacturing;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030195
