Title :
Built-in generation of m-sequences with irreducible characteristic polynomials
Author :
Kagaris, Dimitri
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
In this paper, we show that m-sequences for built in test pattern generation (TPG) can be efficiently generated by LFSR structures that have non-primitive irreducible characteristic polynomials. We present two mechanisms that can generate the required number of seeds with very low hardware overhead that is independent of the number of seeds. This enhances the choices available for the design of appropriate TPG structures for pseudo-exhaustive or pseudo-random TPG that were previously limited to primitive characteristic polynomials only.
Keywords :
automatic test pattern generation; built-in self test; finite state machines; m-sequences; polynomials; ROM-like structure; built-in test pattern generation; irreducible characteristic polynomials; linear FSM; low hardware overhead; m-sequences; Character generation; Chromium; Conferences; Polynomials; Testing;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030200