DocumentCode
2202964
Title
Built-in generation of m-sequences with irreducible characteristic polynomials
Author
Kagaris, Dimitri
Author_Institution
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
fYear
2002
fDate
2002
Firstpage
158
Lastpage
162
Abstract
In this paper, we show that m-sequences for built in test pattern generation (TPG) can be efficiently generated by LFSR structures that have non-primitive irreducible characteristic polynomials. We present two mechanisms that can generate the required number of seeds with very low hardware overhead that is independent of the number of seeds. This enhances the choices available for the design of appropriate TPG structures for pseudo-exhaustive or pseudo-random TPG that were previously limited to primitive characteristic polynomials only.
Keywords
automatic test pattern generation; built-in self test; finite state machines; m-sequences; polynomials; ROM-like structure; built-in test pattern generation; irreducible characteristic polynomials; linear FSM; low hardware overhead; m-sequences; Character generation; Chromium; Conferences; Polynomials; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN
0-7695-1641-6
Type
conf
DOI
10.1109/OLT.2002.1030200
Filename
1030200
Link To Document