DocumentCode :
2202964
Title :
Built-in generation of m-sequences with irreducible characteristic polynomials
Author :
Kagaris, Dimitri
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
fYear :
2002
fDate :
2002
Firstpage :
158
Lastpage :
162
Abstract :
In this paper, we show that m-sequences for built in test pattern generation (TPG) can be efficiently generated by LFSR structures that have non-primitive irreducible characteristic polynomials. We present two mechanisms that can generate the required number of seeds with very low hardware overhead that is independent of the number of seeds. This enhances the choices available for the design of appropriate TPG structures for pseudo-exhaustive or pseudo-random TPG that were previously limited to primitive characteristic polynomials only.
Keywords :
automatic test pattern generation; built-in self test; finite state machines; m-sequences; polynomials; ROM-like structure; built-in test pattern generation; irreducible characteristic polynomials; linear FSM; low hardware overhead; m-sequences; Character generation; Chromium; Conferences; Polynomials; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
Type :
conf
DOI :
10.1109/OLT.2002.1030200
Filename :
1030200
Link To Document :
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