• DocumentCode
    2202964
  • Title

    Built-in generation of m-sequences with irreducible characteristic polynomials

  • Author

    Kagaris, Dimitri

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    158
  • Lastpage
    162
  • Abstract
    In this paper, we show that m-sequences for built in test pattern generation (TPG) can be efficiently generated by LFSR structures that have non-primitive irreducible characteristic polynomials. We present two mechanisms that can generate the required number of seeds with very low hardware overhead that is independent of the number of seeds. This enhances the choices available for the design of appropriate TPG structures for pseudo-exhaustive or pseudo-random TPG that were previously limited to primitive characteristic polynomials only.
  • Keywords
    automatic test pattern generation; built-in self test; finite state machines; m-sequences; polynomials; ROM-like structure; built-in test pattern generation; irreducible characteristic polynomials; linear FSM; low hardware overhead; m-sequences; Character generation; Chromium; Conferences; Polynomials; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030200
  • Filename
    1030200