• DocumentCode
    2203022
  • Title

    A systematic (16, 8) code for correcting double errors, and detecting random triple errors

  • Author

    Klein, Ronald ; Varanasi, Murali ; Dunning, Larry

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1996
  • fDate
    11-14 Apr 1996
  • Firstpage
    284
  • Lastpage
    288
  • Abstract
    We examine several systematic (16,8) codes capable of double error correction (DEC) and triple adjacent error detection. In particular, we examine a linear version of the Nordstrom-Robinson (NR) code in the light of new findings by Hammons (see IEEE Trans. Inform. Theory, vol.40, p.301, 1994) and others, and compare it with the (16, 8) code by Gulliver and Bhargava (see EEE Trans. Comp, vol.42, no.1, p.109, 1993). The NR code is non-linear, and because of its lack of algebraic structure, does not lend itself easily to use in its original form. However, it is now known that the NR code is the binary image of the octacode, and the octacode is a linear code. As a result of these new insights, we show that the NR code can be used to correct double errors (DEC), and simultaneously detect triple random errors (TED). These results are compared to the Gulliver and Bhargava (16, 8) code and summarized. We show that the linear form of the NR code can be decoded efficiently
  • Keywords
    decoding; error correction codes; error detection codes; linear codes; Nordstrom-Robinson code; binary image; decoding; double error correcting code; double error correction; linear code; nonlinear code; octacode; random triple error detecting code; systematic codes; triple adjacent error detection; Computer errors; Computer science; Decoding; Digital communication; Digital systems; Error correction codes; Fault tolerance; Linear code; Redundancy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '96. Bringing Together Education, Science and Technology., Proceedings of the IEEE
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    0-7803-3088-9
  • Type

    conf

  • DOI
    10.1109/SECON.1996.510075
  • Filename
    510075