DocumentCode :
2203197
Title :
Using concurrent and semi-concurrent on-line testing during HLS: an adaptable approach
Author :
Naal, M.A. ; Rakotoar, M. ; Simeu, E. ; Aktouf, C.
Author_Institution :
TIMA Lab., Grenoble, France
fYear :
2002
fDate :
2002
Firstpage :
184
Abstract :
This paper proposes a suitable on-line testing technique during the synthesis of complex electronic structures. Online testability is addressed by exploiting time redundancy in the scheduled data flow graph. On-line testability constraints are taken into account at the scheduling and allocation tasks. The technique implements non-concurrent; semi-concurrent or fully concurrent on-line tests according to the ability of the synthesized structure.
Keywords :
data flow graphs; design for testability; genetic algorithms; high level synthesis; logic testing; redundancy; IIR elliptic filter; allocation tasks; concurrent on-line testing; digital filters; genetic algorithms; high level synthesis; on-line testability; scheduled data flow graph; semi-concurrent on-line testing; testability constraints; time redundancy; Band pass filters; Circuit faults; Circuit testing; Delay; Flow graphs; High level synthesis; IIR filters; Laboratories; Sampling methods; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
Type :
conf
DOI :
10.1109/OLT.2002.1030208
Filename :
1030208
Link To Document :
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