• DocumentCode
    2203197
  • Title

    Using concurrent and semi-concurrent on-line testing during HLS: an adaptable approach

  • Author

    Naal, M.A. ; Rakotoar, M. ; Simeu, E. ; Aktouf, C.

  • Author_Institution
    TIMA Lab., Grenoble, France
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    184
  • Abstract
    This paper proposes a suitable on-line testing technique during the synthesis of complex electronic structures. Online testability is addressed by exploiting time redundancy in the scheduled data flow graph. On-line testability constraints are taken into account at the scheduling and allocation tasks. The technique implements non-concurrent; semi-concurrent or fully concurrent on-line tests according to the ability of the synthesized structure.
  • Keywords
    data flow graphs; design for testability; genetic algorithms; high level synthesis; logic testing; redundancy; IIR elliptic filter; allocation tasks; concurrent on-line testing; digital filters; genetic algorithms; high level synthesis; on-line testability; scheduled data flow graph; semi-concurrent on-line testing; testability constraints; time redundancy; Band pass filters; Circuit faults; Circuit testing; Delay; Flow graphs; High level synthesis; IIR filters; Laboratories; Sampling methods; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030208
  • Filename
    1030208