Abstract :
Since the first days of the space conquest, electronic components have changed remarkably. In the seventies, single event effects (SEE), caused by heavy ions and protons, were unknown. The increase in integration density led first to single event upsets and later, with the CMOS technology, single event latchups etc... The end of the cold war crashed the military market and, since that, the growing acceptance of COTS components in space systems has encouraged the major manufacturers to withdraw from the RadHard component production. Therefore, one had to start testing of the SEE durability of COTS components with particle accelerators.
Keywords :
cyclotrons; integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); space vehicle electronics; COTS components; ECR-ion sources; H-minus ion source; RADEF radiation effects facility; backward irradiations; durability; high-charge-state heavy ions; high-penetration cocktails; intense Protons; sector-focused cyclotron; single event effects; single event latchups; single event upsets; space systems; CMOS technology; Computer crashes; Electronic components; Manufacturing; Production systems; Protons; Radiation effects; Single event upset; Space technology; Vehicle crash testing;
