Title :
Sequential n-detection criteria: keep it simple!
Author :
Polian, Ilia ; Keim, Martin ; Mallig, Nicolai ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-Univ., Freiburg Im Breisgau, Germany
Abstract :
The idea of n-detection is to exposure a target fault in n different ways. A major concern about the n-detection has been the question whether different test vectors really do excite the fault in different ways leading to different activation and propagation conditions. A special problem was the lack of methodology for answering this question. Our goal was to develop such a methodology and to evaluate its usefulness. In this work, we use a bridging fault-based non-target fault model for evaluating n-detect sequences.
Keywords :
Boolean functions; automatic test pattern generation; binary decision diagrams; fault simulation; logic testing; sequential circuits; BDD-based algorithm; Boolean values; bridging fault-based model; difference types; minimal-length test sequences; nontarget fault model; pair of sequences; sequential n-detection criteria; stuck-at fault; target fault; Boolean functions; Circuit faults; Circuit testing; Computational complexity; Concatenated codes; Conferences; Data structures; Electrical fault detection; Fault detection; Upper bound;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030213