• DocumentCode
    2203326
  • Title

    Sequential n-detection criteria: keep it simple!

  • Author

    Polian, Ilia ; Keim, Martin ; Mallig, Nicolai ; Becker, Bernd

  • Author_Institution
    Albert-Ludwigs-Univ., Freiburg Im Breisgau, Germany
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    189
  • Lastpage
    190
  • Abstract
    The idea of n-detection is to exposure a target fault in n different ways. A major concern about the n-detection has been the question whether different test vectors really do excite the fault in different ways leading to different activation and propagation conditions. A special problem was the lack of methodology for answering this question. Our goal was to develop such a methodology and to evaluate its usefulness. In this work, we use a bridging fault-based non-target fault model for evaluating n-detect sequences.
  • Keywords
    Boolean functions; automatic test pattern generation; binary decision diagrams; fault simulation; logic testing; sequential circuits; BDD-based algorithm; Boolean values; bridging fault-based model; difference types; minimal-length test sequences; nontarget fault model; pair of sequences; sequential n-detection criteria; stuck-at fault; target fault; Boolean functions; Circuit faults; Circuit testing; Computational complexity; Concatenated codes; Conferences; Data structures; Electrical fault detection; Fault detection; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030213
  • Filename
    1030213