On-line testing of embedded systems using optical probes: system modeling and probing technology

Many embedded systems operate in very hostile environments. The electronics, i.e. microprocessors, RAMs and other vital electronic devices could suffer from erroneous data, superior output signals caused by the bombardment of particles (e.g. dust). It is crucial to build solutions that allow efficient on-line tests to be applied and test results to be checked. A practical on-line testing strategy continuously checks the correct functioning of embedded systems in hostile environments. The originality of the work concerns test results which are continuously sent to a remote system.