Title :
An off-chip sensor circuit for on-line transient current testing
Author :
Alorda, B. ; Ivanov, A. ; Segura, J.
Author_Institution :
Dept. de Fisica, Univ. de les Illes Baleares, Palma de Mallorca, Spain
Abstract :
We propose and evaluate an architecture of an integrated transient current off-chip monitor to facilitate implementation of transient current based testing of CMOS VLSI circuits. The monitor measures the transient current idd(t) by sensing the voltage drop at a resistor and provides the charge delivered to the circuit (i.e. the area under the waveform) as the test observable. Designed in 0.18 μm CMOS technology, the sensor measures the transient supply current and provides the waveform area (i.e. the charge delivered to the circuit). The transient current is measured at the circuit supply rail, by sensing the voltage drop at a resistor connected between the IC supply PIN and the voltage source as shown in Figure 1.
Keywords :
CMOS analogue integrated circuits; VLSI; electric current measurement; integrated circuit testing; operational amplifiers; CMOS VLSI circuits; CMOS operational amplifier; CUT model; HSPICE; integrated monitor; off-chip sensor circuit; on-line transient current testing; transient supply current; voltage drop; Area measurement; CMOS technology; Charge measurement; Circuit testing; Current measurement; Integrated circuit measurements; Monitoring; Resistors; Very large scale integration; Voltage;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030215