DocumentCode
2203386
Title
Engineering analysis of electrical effects for the COTP 500 KV transmission line and EBMUD aqueduct corridor
Author
Lewis, Orlyn C. ; Bell, G. Kurt ; Ma, Jinxi
Author_Institution
East Bay Municipal Utility District, Oakland, CA, USA
Volume
3
fYear
1995
fDate
8-12 Oct 1995
Firstpage
2255
Abstract
A study was conducted to determine AC electrical interference effects arising in the East Bay Municipal Utility District´s (EBMUD) Mokelumne Aqueducts due to their proximity to the Olinda-Tracy 500 kilovolt (kV) transmission line operated by the Western Area Power Administration (WESTERN). A six-wire gradient control wire mitigation system selected by EBMUD was modeled and evaluated. The study shows that the mitigation system performs satisfactorily under all conditions examined. During steady state conditions, touch voltages are maintained below 15 volts throughout the entire length of the three aqueducts. During fault conditions, touch voltages are maintained below 263 volts. The design limit calculated according to ANSI/IEEE Standard 80. The currents flowing through the isolator/surge protectors do not exceed the ratings of these devices, during steady state and fault conditions
Keywords
electromagnetic interference; power system protection; power transmission lines; surge protection; 500 kV; ANSI/IEEE Standard 80; California Oregon Transmission Project; EBMUD aqueduct corridor; East Bay Municipal Utility District; Mokelumne Aqueducts; Olinda-Tracy transmission line; Western Area Power Administration; conductive coupling; electrical effects; inductive coupling; isolator/surge protectors; six-wire gradient control wire mitigation system; steady state conditions; touch voltages; ANSI standards; Control system synthesis; Interference; Isolators; Power engineering and energy; Power system modeling; Power transmission lines; Steady-state; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location
Orlando, FL
ISSN
0197-2618
Print_ISBN
0-7803-3008-0
Type
conf
DOI
10.1109/IAS.1995.530590
Filename
530590
Link To Document