• DocumentCode
    2203386
  • Title

    Engineering analysis of electrical effects for the COTP 500 KV transmission line and EBMUD aqueduct corridor

  • Author

    Lewis, Orlyn C. ; Bell, G. Kurt ; Ma, Jinxi

  • Author_Institution
    East Bay Municipal Utility District, Oakland, CA, USA
  • Volume
    3
  • fYear
    1995
  • fDate
    8-12 Oct 1995
  • Firstpage
    2255
  • Abstract
    A study was conducted to determine AC electrical interference effects arising in the East Bay Municipal Utility District´s (EBMUD) Mokelumne Aqueducts due to their proximity to the Olinda-Tracy 500 kilovolt (kV) transmission line operated by the Western Area Power Administration (WESTERN). A six-wire gradient control wire mitigation system selected by EBMUD was modeled and evaluated. The study shows that the mitigation system performs satisfactorily under all conditions examined. During steady state conditions, touch voltages are maintained below 15 volts throughout the entire length of the three aqueducts. During fault conditions, touch voltages are maintained below 263 volts. The design limit calculated according to ANSI/IEEE Standard 80. The currents flowing through the isolator/surge protectors do not exceed the ratings of these devices, during steady state and fault conditions
  • Keywords
    electromagnetic interference; power system protection; power transmission lines; surge protection; 500 kV; ANSI/IEEE Standard 80; California Oregon Transmission Project; EBMUD aqueduct corridor; East Bay Municipal Utility District; Mokelumne Aqueducts; Olinda-Tracy transmission line; Western Area Power Administration; conductive coupling; electrical effects; inductive coupling; isolator/surge protectors; six-wire gradient control wire mitigation system; steady state conditions; touch voltages; ANSI standards; Control system synthesis; Interference; Isolators; Power engineering and energy; Power system modeling; Power transmission lines; Steady-state; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3008-0
  • Type

    conf

  • DOI
    10.1109/IAS.1995.530590
  • Filename
    530590